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Analytical Chemistry & Spectroscopy

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Secondary Standard Analytical Chemistry & Spectroscopy mol/L A solution whose concentration has been established by titration against a primary standard. Sensitivity Analytical Chemistry & Spectroscopy Various The change in an instrument's response for a given change in analyte concentration. S = dSignal / dConcentration Specificity Analytical Chemistry & Spectroscopy Dimensionless The ability of a method to measure the analyte accurately in the presence of everything else in the sample. Spin–Spin Coupling Analytical Chemistry & Spectroscopy Hz The splitting of an NMR signal into multiple lines caused by interaction with neighbouring non-equivalent nuclei. n + 1 rule Standard Deviation Analytical Chemistry & Spectroscopy Various A statistical measure of the spread of a set of repeated measurements about their mean. s = √(Σ(xᵢ − x̄)² / (n − 1)) Standardisation Analytical Chemistry & Spectroscopy mol/L The determination of the exact concentration of a solution by titrating it against a primary standard. M₁V₁ / n₁ = M₂V₂ / n₂ Stationary Phase Analytical Chemistry & Spectroscopy Dimensionless The fixed material in a chromatographic system with which the sample components interact as they pass. Systematic Error Analytical Chemistry & Spectroscopy Various An error that shifts every result in the same direction by a similar amount. Thin Layer Chromatography Analytical Chemistry & Spectroscopy Dimensionless A chromatographic technique using a thin layer of adsorbent coated on a flat plate. Ultraviolet–Visible Spectroscopy Analytical Chemistry & Spectroscopy nm A technique that measures the absorption of ultraviolet and visible light by electronic transitions within molecules. A = log(I₀/I) Volumetric Analysis Analytical Chemistry & Spectroscopy mL Quantitative analysis based on measuring the volume of a standard solution needed to react with the analyte. n = M × V X-ray Crystallography Analytical Chemistry & Spectroscopy pm A technique that determines the three-dimensional atomic structure of a crystal from its X-ray diffraction pattern. nλ = 2d sin θ